Beijing Guangguang Instrument Co., Ltd
Home>Products>9XF Research Grade (Reflective) Metallographic Microscope
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    No. 253 Songhuajiang Road, Yangpu District, Shanghai
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9XF Research Grade (Reflective) Metallographic Microscope
Widely used in teaching, scientific research, metallographic analysis, semiconductor silicon chip detection, address mineral analysis, precision engin
Product details

1.1 Suitable for power supply 220V (10%)/50Hz, temperature range of 5 ℃~30 ℃
Operate under environmental conditions with relative humidity below 75%.

1.2 It is recommended to place it on an earthquake resistant workbench in a clean environment.

(1) Optical system: Infinite achromatic optical system correction system

(2) Eyepiece: High eye point, large field of view, flat field eyepiece PL10X/22mm, adjustable visual acuity

(3) Lens barrel: hinged three eyes (infinite); 30 ° tilt, 360 ° rotation;
Pupil distance adjustment range: 54mm-75mm; Visual acuity adjustment ± 5 °;
Two levels of spectral ratio R: T=100: 0 or 50:50

(4) Objective lens:Infinite long working distance flat field achromatic metallographic objective lens
(5X/ 10X/ 20X/ 50X)

(Standard) Achieve magnification under 10x eyepiece: (50X、100X、200X、500X)

(Optional) If you need other magnifications, please refer to the expansion (optional) attachment or consult customer service

(5) Objective lens converter:Internal positioning 5-hole converter

(6) Stage: Double layer mechanical mobile platform, with coaxial adjustment in the X and Y directions at the low hand position;
Platform area 175mmX145mm, movement range: 76mmX42mm

(7) Focusing mechanism: Dual purpose frame for transmission and reflection, low hand position coarse and micro coaxial focusing mechanism. Rough adjustment of travel
28mm, with platform position up and down adjustment mechanism, maximum sample height 78mm, fine adjustment
Accuracy 0.002mm. Equipped with anti slip elastic adjustment device and random upper limit device

(8) Spotlight: Shake out achromatic spotlight (N.A 0.9) (for transmission)

(8) Lighting system:

Kola lighting system with field stop and aperture stop, adjustable center; Equipped with oblique lighting device
(Light bulb 12v50w)

High resolution microscope camera (optional)

3.1 Ideal use of microscope perspective: with an observation field twice that of a 2/3 "camera, possessing
Overview image of color samples

3.2 USB 2.0/3.0 interface, fast data transfer rate, can achieve high frame rate

3.3 Apply dual pixel technology while still retaining sufficient pixels for accurate image processing

3.4 Flexible application in various applications

3.5 Record images at high frame rates to achieve precise observation of dynamic processes

Professional Microscopic Image Analysis Software (optional)

4.1 Complies with GB15445, American ASTM112, and ISO9276 standards;

4.2 Supports TWAIN interface standard scanners and digital cameras, and supports multiple image acquisition cards;

4.3 Fully utilize WINDOWS system resources and fully support WIN95 and WIN98 operating environments;

4.4 Newer programming methods, fully localized graphic and textual interface, available with a graphical toolbar, for use
conciseIntuitive, convenient, and fast analysis can be completed with just a click of the mouse;

4.5 Provide online Chinese help prompts, without the need for professional training, to master the usage methods;

4.6 Provide a variety of powerful area selection tools that can process and analyze areas of any shape

4.7 can complete tasks including chromaticity adjustment, image transformation, mathematical morphology processing, image enhancement, and image processing
matchMore than 100 professional image processing and analysis functions, including texture analysis and feature recognition;

4.8 Supports 24 bit true color image acquisition, RGB, CMY, HSV, Lab, YUV, etc
colorProcessing and analysis of models;

4.9 Visualize the analysis data to establish a direct mapping relationship between the analysis results and the image, facilitating
observeInspection and analysis;

Advanced particle automatic recognition and adhesive particle automatic segmentation functions ensure the accuracy of complex images
Accurate analysis;

4.11 Automatic analysis and processing step editing function, capable of setting up a fully automated analysis process;

4.12 Regret step and repeat function, enabling users to find the ideal processing path;

4.13 Geometric parameter measurement function for various feature bodies such as slender bodies, block bodies, granular bodies, and linear bodies
Automatic quantitative analysis function, with over 10000 analysis parameters.

4.14 The analysis results can be stored in a database for statistical analysis, creating charts, printing reports, and can be
Output images in photo quality.

39XF Research Grade (Reflective) Metallographic Microscope Kit

Completeness(packing list)

Serial Number

name

unit

quantity

notes

1

Microscope host

tower

1

2

trinocular tube

only

1

3

Reflective Illuminator

only

1

4

Objective lens(5x10x20x50x

only

every1

5

eyepiece

answer

1

6

workbenches

only

1

7

Abbe condenser

only

1

8

upper/Lower light source lightbox

a flat

1

9

Polarizing film (reflective light path)

group

1

10

power line

root

1

11

light bulb12v50w

only

1

standby

12

certificate of conformity

share

1

13

warranty card

share

1

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